Power-constrained testing of VLSI circuits /

Power-constrained testing of VLSI circuits /

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Bibliografske podrobnosti
Glavni avtor: Nicolici, Nicola (Author)
Drugi avtorji: Al-Hashimi, Bashir M.
Format: Knjiga
Jezik:English
Izdano: Boston Kluwer c2003
Serija:Frontiers in electronic testing ;
Teme:
Integrated circuits, very large scale integration > Protection.
Integrated circuits > Very large scale integration > Testing.
Semiconductors > Thermal properties.
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