Power-constrained testing of VLSI circuits /

類似資料

• VLSI test principles and architectures : design for testability /
  出版事項: (2006)
• Introduction to VLSI testing /
  著者:: Feugate, Robert J.
  出版事項: (1988)
• VLSI testing : digital and mixed analogue/digital techniques /
  著者:: Hurst, Stanley L.
  出版事項: (1998)
• VLSI testing : digital and mixed analogue/digital techniques /
  著者:: Hurst, Stanley L.
• The design and analysis of VLSI circuits /
  著者:: Glasser, Lance A.
  出版事項: (1985)