Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

अन्य संस्करण दिखाएं (3)

में बचाया:

ग्रंथसूची विवरण
मुख्य लेखक:	Bushnell, Michael L. (Michael Lee), 1950- (लेखक)
अन्य लेखक:	Agrawal, Vishwani D., 1943-
स्वरूप:	पुस्तक
भाषा:	English
प्रकाशित:	Boston Springer 2000.
श्रृंखला:	Frontiers in electronic testing; 17
विषय:	Integrated circuits > Very large scale integration > Testing. Digital integrated circuits > Testing. Mixed signal circuits > Testing. Semiconductor storage devices > Testing.
ऑनलाइन पहुंच:	Click here to view the full text content
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