Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

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書誌詳細
第一著者:	Bushnell, Michael L. (Michael Lee), 1950- (著者)
その他の著者:	Agrawal, Vishwani D., 1943-
フォーマット:	図書
言語:	English
出版事項:	Boston Springer 2000.
シリーズ:	Frontiers in electronic testing; 17
主題:	Integrated circuits > Very large scale integration > Testing. Digital integrated circuits > Testing. Mixed signal circuits > Testing. Semiconductor storage devices > Testing.
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