Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits /

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Opis bibliograficzny
1. autor:	Bushnell, Michael L. (Michael Lee), 1950- (Autor)
Kolejni autorzy:	Agrawal, Vishwani D., 1943-
Format:	Książka
Język:	English
Wydane:	Boston Springer 2000.
Seria:	Frontiers in electronic testing; 17
Hasła przedmiotowe:	Integrated circuits > Very large scale integration > Testing. Digital integrated circuits > Testing. Mixed signal circuits > Testing. Semiconductor storage devices > Testing.
Dostęp online:	Click here to view the full text content
Etykiety:	Dodaj etykietę Nie ma etykietki, Dołącz pierwszą etykiete!

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