Surface and grain size characterization of gallium and tantalum doped Ba0.5Sr0.5TiO3 Thin film using atomic force microscope (AFM)

Surface and grain size characterization of gallium and tantalum doped Ba0.5Sr0.5TiO3 Thin film using atomic force microscope (AFM)

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Dettagli Bibliografici
Autore principale:	Safinah Nor Bt Jusoh (Autore)
Natura:	Libro
Lingua:	English
Soggetti:	Atomic force microscopy
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