Surface and grain size characterization of gallium and tantalum doped Ba0.5Sr0.5TiO3 Thin film using atomic force microscope (AFM)

Surface and grain size characterization of gallium and tantalum doped Ba0.5Sr0.5TiO3 Thin film using atomic force microscope (AFM)

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Bibliografische gegevens
Hoofdauteur:	Safinah Nor Bt Jusoh (Auteur)
Formaat:	Boek
Taal:	English
Onderwerpen:	Atomic force microscopy
Tags:	Voeg label toe Geen labels, Wees de eerste die dit record labelt!

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