Principles of semiconductor network testing

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor...

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Bibliographic Details
Main Author: Afshar, Amir (Author)
Format: Electronic Software eBook
Language:English
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Summary:This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.
Physical Description:1CD-ROM 4 3/4 in.
ISBN:9780080539560 (electronic bk.)
0080539564 (electronic bk.)