Principles of semiconductor network testing

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor...

Full description

Saved in:
Bibliographic Details
Main Author: Afshar, Amir (Author)
Format: Electronic Software eBook
Language:English
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!