Reactive ion etching (RIE) etched wet-silica-on-silicon analysis for fluidwettability
The objective of this project is to analyze fluid wettability with water droplets testing on etched silicon thus to observe the characterization on wafer surface profile of RIE etched wet-silica-on-silicon using Atomic Force Microscope (AFM).
Saved in:
| 主要作者: | |
|---|---|
| 格式: | 電子 軟件 Database |
| 語言: | English |
| 主題: | |
| 標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|
System Under Maintenance
Our Library Management System is currently under maintenance.
Holdings and item availability information is currently unavailable. Please accept our apologies for any inconvenience this may cause and contact us for further assistance: