Investigation and modelling of boron diffusion reduction in silicon by fluorine implantation using numerical simulation

TThe objective of this project is to investigate the reduction of both the boron thermal diffusion and transient enhanced diffusion in silicon by fluorine implantation at the silicon surface.

Kaydedildi:
Detaylı Bibliyografya
Yazar: Chuah, Soo Kiet (Yazar)
Materyal Türü: Elektronik Yazılım Veritabanı
Dil:English
Konular:
Etiketler: Etiketle
Etiket eklenmemiş, İlk siz ekleyin!