Effect of different dielectric materials for ultrathin oxide
This final year project is about performance of ultrathin gate oxide using Silicon Nitride to replace the Silicon Dioxide as dielectric materials and use the Synopsys's Taurus TCAD tools to fabricate virtual semiconductor devices as a virtual fabrication environment.
Saved in:
主要作者: | |
---|---|
格式: | 电子 软件 数据库 |
语言: | English |
主题: | |
标签: |
添加标签
没有标签, 成为第一个标记此记录!
|
System Under Maintenance
Our Library Management System is currently under maintenance.
Holdings and item availability information is currently unavailable. Please accept our apologies for any inconvenience this may cause and contact us for further assistance: