Analysis of deposited carbon based on electron beam induced deposition in scanning electron microscopy using secondary ion mass spectrometry
Many experiments on the mechanics of nanostructures require the creation of rigid clamps at specific locations. In this final year project, electron beam induced deposition (EBID) has been used to deposit carbon films that are similar to those that have recently been used for clamping nanostructures...
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| 第一著者: | |
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| フォーマット: | 電子媒体 ソフトウェア データベース |
| 言語: | English |
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| 要約: | Many experiments on the mechanics of nanostructures require the creation of rigid clamps at specific locations. In this final year project, electron beam induced deposition (EBID) has been used to deposit carbon films that are similar to those that have recently been used for clamping nanostructures. The scope of this project is to analyze the purity of carbon with varies of acceleration voltages. |
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| 記述事項: | Final Year Project |
| 物理的記述: | 1 CD-ROM 4 3/4 in. |