High-level test synthesis of digital VLSI circuits /

High-level test synthesis of digital VLSI circuits /

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Detalles Bibliográficos
Autor principal: Lee, Mike Tien - Chien (Autor)
Formato: Libro
Lenguaje:English
Publicado: Boston Artech House c1997
Colección:The Artech House solid-state technology library
Materias:
Integrated circuits > Very large scale integration > Design and construction > Data processing.
Integrated circuits > Very large scale integration > Testing > Data processing.
Computer-aided design.
Digital integrated circuits > Testing > Data processing.
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