High-level test synthesis of digital VLSI circuits /

High-level test synthesis of digital VLSI circuits /

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Opis bibliograficzny
1. autor:	Lee, Mike Tien - Chien (Autor)
Format:	Książka
Język:	English
Wydane:	Boston Artech House c1997
Seria:	The Artech House solid-state technology library
Hasła przedmiotowe:	Integrated circuits > Very large scale integration > Design and construction > Data processing. Integrated circuits > Very large scale integration > Testing > Data processing. Computer-aided design. Digital integrated circuits > Testing > Data processing.
Etykiety:	Dodaj etykietę Nie ma etykietki, Dołącz pierwszą etykiete!

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