High-level test synthesis of digital VLSI circuits /

High-level test synthesis of digital VLSI circuits /

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Библиографические подробности
Главный автор:	Lee, Mike Tien - Chien (Автор)
Формат:	‌
Язык:	English
Опубликовано:	Boston Artech House c1997
Серии:	The Artech House solid-state technology library
Предметы:	Integrated circuits > Very large scale integration > Design and construction > Data processing. Integrated circuits > Very large scale integration > Testing > Data processing. Computer-aided design. Digital integrated circuits > Testing > Data processing.
Метки:	Добавить метку Нет меток, Требуется 1-ая метка записи!

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