An analysis of threshold voltage control for deep sub-micrometer fully depleted 18nm SOI MOSFET /

An analysis of threshold voltage control for deep sub-micrometer fully depleted 18nm SOI MOSFET /

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Bibliographic Details
Main Author: Muhammad Zulkhairi Inche Muhammad Zulfikri (Author)
Format: Software eBook
Language:English
Published: 2018.
Subjects:
Silicon-on-insulator technology.
Semiconductors.
Metal oxide semiconductor field-effect transistors.
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Perpustakaan Laman Hikmah Kampus Induk, UTeM: 1

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Media Room, Perpustakaan Laman Hikmah Kampus Induk, UTeM: Unknown

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