An analysis of threshold voltage control for deep sub-micrometer fully depleted 18nm SOI MOSFET /

An analysis of threshold voltage control for deep sub-micrometer fully depleted 18nm SOI MOSFET /

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Bibliographic Details
Main Author:	Muhammad Zulkhairi Inche Muhammad Zulfikri (Author)
Format:	Software eBook
Language:	English
Published:	2018.
Subjects:	Silicon-on-insulator technology. Semiconductors. Metal oxide semiconductor field-effect transistors.
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