Accelerating image processing of wafer inspection /

Accelerating image processing of wafer inspection /

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Bibliographic Details
Main Authors: Sani Irwan Md Salim, Dr (Author), Lim, Kim Chuan, Associate Professor Dr (Author), Zulkarnain Mohd Yussof, Professor Dr (Author), Choon, Chin Yoon (Author)
Format: Kit
Language:English
Published: Durian Tunggal, Melaka : Faculty of Electronics and Computer Engineering, 2020.
Subjects:
Image processing.
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Unit Digital, Perpustakaan Laman Hikmah Kampus Induk, UTeM: 5

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