Accelerating image processing of wafer inspection /
Wedi'i Gadw mewn:
| Prif Awduron: | , , , |
|---|---|
| Fformat: | Cit |
| Iaith: | English |
| Cyhoeddwyd: |
Durian Tunggal, Melaka :
Faculty of Electronics and Computer Engineering,
2020.
|
| Pynciau: | |
| Tagiau: |
Ychwanegu Tag
Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!
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| 100 | 0 | |a Sani Irwan Md Salim, |c Dr., |e author. |9 167646 | |
| 245 | 1 | 0 | |a Accelerating image processing of wafer inspection / |c Dr. Sani Irwan Md Salim, Associate Professor Dr. Lim Kim Chuan, Professor Dr. Zulkarnain Mohd Yusof, Choo Chin Yoon. |
| 264 | 1 | |a Durian Tunggal, Melaka : |b Faculty of Electronics and Computer Engineering, |c 2020. | |
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| 650 | 0 | |a Image processing. |9 4507 | |
| 700 | 1 | |a Lim, Kim Chuan, |c Associate Professor Dr., |e author. |9 167647 | |
| 700 | 0 | |a Zulkarnain Mohd Yussof, |c Professor Dr., |e author. |9 167648 | |
| 700 | 1 | |a Choon, Chin Yoon, |e author. |9 167649 | |
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