Analysis and test development for parasitic fails in deep sub-micron memory devices

Analysis and test development for parasitic fails in deep sub-micron memory devices

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Bibliografske podrobnosti
Glavni avtor: Irobi, Ijeoma Sandra
Format: Knjiga
Jezik:English
Izdano: [S.l.] [s.n.] 2011
Teme:
Semiconductor storage devices > Testing
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Perpustakaan Laman Hikmah Kampus Induk, UTeM: Open Shelf

Podrobnosti zaloge Perpustakaan Laman Hikmah Kampus Induk, UTeM: Open Shelf
Signatura: TK7895 M4 I76 2011
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