Cita APA (7a ed.)

Irobi, I. S. (2011). Analysis and test development for parasitic fails in deep sub-micron memory devices. [s.n.].

Cita Chicago Style (17a ed.)

Irobi, Ijeoma Sandra. Analysis and Test Development for Parasitic Fails in Deep Sub-micron Memory Devices. [S.l.]: [s.n.], 2011.

Cita MLA (8a ed.)

Irobi, Ijeoma Sandra. Analysis and Test Development for Parasitic Fails in Deep Sub-micron Memory Devices. [s.n.], 2011.