Analysis and test development for parasitic fails in deep sub-micron memory devices

Analysis and test development for parasitic fails in deep sub-micron memory devices

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Bibliographic Details
Main Author: Irobi, Ijeoma Sandra
Format: Book
Language:English
Published: [S.l.] [s.n.] 2011
Subjects:
Semiconductor storage devices > Testing
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Perpustakaan Laman Hikmah Kampus Induk, UTeM: Open Shelf

Holdings details from Perpustakaan Laman Hikmah Kampus Induk, UTeM: Open Shelf
Call Number: TK7895 M4 I76 2011
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