Genetic algorithm for very large scale integration (VLSI) test generation

Genetic algorithm for very large scale integration (VLSI) test generation

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Príomhchruthaitheoir: Wong, Yan Chiew
Údar corparáideach: Universiti Teknikal Malaysia Melaka. Faculty of Electronics and Computer Engineering
Formáid: LEABHAR
Teanga:English
Foilsithe / Cruthaithe: Durian Tunggal Universiti Teknikal Malaysia Melaka 2009
Ábhair:
Integrated circuits > Very large scale integration > Testing
Integrated circuits > Very large scale integration > Design and construction
Genetic algorithms
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