Wong, Y. C. (2009). Genetic algorithm for very large scale integration (VLSI) test generation. Universiti Teknikal Malaysia Melaka.
Chicago Style (17th ed.) CitationWong, Yan Chiew. Genetic Algorithm for Very Large Scale Integration (VLSI) Test Generation. Durian Tunggal: Universiti Teknikal Malaysia Melaka, 2009.
MLA citiranjeWong, Yan Chiew. Genetic Algorithm for Very Large Scale Integration (VLSI) Test Generation. Universiti Teknikal Malaysia Melaka, 2009.
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