Genetic algorithm for very large scale integration (VLSI) test generation

Genetic algorithm for very large scale integration (VLSI) test generation

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Bibliografiske detaljer
Hovedforfatter: Wong, Yan Chiew
Institution som forfatter: Universiti Teknikal Malaysia Melaka. Faculty of Electronics and Computer Engineering
Format: Bog
Sprog:English
Udgivet: Durian Tunggal Universiti Teknikal Malaysia Melaka 2009
Fag:
Integrated circuits > Very large scale integration > Testing
Integrated circuits > Very large scale integration > Design and construction
Genetic algorithms
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Beskrivelse
Emne beskrivelse:Penyelidikan Jangka Pendek (PJP/2008/FKEKK(7)-S435)
Fysisk beskrivelse:xi, 75 p. ill. 30 cm

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