Genetic algorithm for very large scale integration (VLSI) test generation

Genetic algorithm for very large scale integration (VLSI) test generation

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Bibliographic Details
Main Author: Wong, Yan Chiew
Corporate Author: Universiti Teknikal Malaysia Melaka. Faculty of Electronics and Computer Engineering
Format: Book
Language:English
Published: Durian Tunggal Universiti Teknikal Malaysia Melaka 2009
Subjects:
Integrated circuits > Very large scale integration > Testing
Integrated circuits > Very large scale integration > Design and construction
Genetic algorithms
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