Progress in measurement and testing selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China

Progress in measurement and testing selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China

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Bibliographic Details
Corporate Author: International Conference on Advanced Measurement and Test Sanya Shi, China
Other Authors: Wu, Yanwen
Format: Conference Proceeding Book
Published: Stafa-Zurich Trans-Tech Pub. 2010
Series:Advanced materials research v. 108-111
Subjects:
Industrial design > Congresses
Materials science > Congresses
Materials > Testing > Congresses
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Perpustakaan Laman Hikmah Kampus Teknologi, UTeM: Open Shelf

Holdings details from Perpustakaan Laman Hikmah Kampus Teknologi, UTeM: Open Shelf
Call Number: TA401 3 I65 2010
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