International Conference on Advanced Measurement and Test Sanya Shi, China, & Wu, Y. (2010). Progress in measurement and testing: Selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China. Trans-Tech Pub.
Chicago Style (17th ed.) CitationInternational Conference on Advanced Measurement and Test Sanya Shi, China, and Yanwen Wu. Progress in Measurement and Testing: Selected, Peer Reviewed Papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China. Stafa-Zurich: Trans-Tech Pub, 2010.
MLA (8th ed.) CitationInternational Conference on Advanced Measurement and Test Sanya Shi, China, and Yanwen Wu. Progress in Measurement and Testing: Selected, Peer Reviewed Papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China. Trans-Tech Pub, 2010.