Progress in measurement and testing selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China
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Corporate Author: | International Conference on Advanced Measurement and Test Sanya Shi, China |
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Other Authors: | Wu, Yanwen |
Format: | Conference Proceeding Book |
Published: |
Stafa-Zurich
Trans-Tech Pub.
2010
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Series: | Advanced materials research
v. 108-111 |
Subjects: | |
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