Testing and testable design of high-density random-access memories

Testing and testable design of high-density random-access memories

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Wedi'i Gadw mewn:

Manylion Llyfryddiaeth
Prif Awdur:	Mazumder, Pinaki
Awduron Eraill:	Chakraborty, Kanad
Fformat:	Llyfr
Cyhoeddwyd:	Boston, MA Kluwer Academic Pub. 1996
Cyfres:	Frontiers in electronic testing
Pynciau:	Random access memory > Testing
Tagiau:	Ychwanegu Tag Dim Tagiau, Byddwch y cyntaf i dagio'r cofnod hwn!

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