Testing and testable design of high-density random-access memories

Testing and testable design of high-density random-access memories

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Détails bibliographiques
Auteur principal:	Mazumder, Pinaki
Autres auteurs:	Chakraborty, Kanad
Format:	Livre
Publié:	Boston, MA Kluwer Academic Pub. 1996
Collection:	Frontiers in electronic testing
Sujets:	Random access memory > Testing
Tags:	Ajouter un tag Pas de tags, Soyez le premier à ajouter un tag!

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