Testability and fault tolerance for emerging nanoelectronic memories
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| Main Author: | |
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| Format: | Thesis Book |
| Published: |
United Kingdom
University of Newcastle
2012
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| Subjects: | |
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Perpustakaan Laman Hikmah Kampus Induk, UTeM: Archives
| Call Number: |
QA76 9 F38 N67 2012 |
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| Copy Unknown | Available Place a Hold |