Nor Zaidi Haron. (2012). Testability and fault tolerance for emerging nanoelectronic memories. University of Newcastle.
Chicago Style (17th ed.) CitationNor Zaidi Haron. Testability and Fault Tolerance for Emerging Nanoelectronic Memories. United Kingdom: University of Newcastle, 2012.
MLA (8th ed.) CitationNor Zaidi Haron. Testability and Fault Tolerance for Emerging Nanoelectronic Memories. University of Newcastle, 2012.
Warning: These citations may not always be 100% accurate.