Testing and testable design of high-density random-access memories
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| Main Author: | |
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| Format: | Book |
| Published: |
Boston, MA
Kluwer Academic Pub.
1996
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| Series: | Frontiers in electronic testing
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| Subjects: | |
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Perpustakaan Laman Hikmah Kampus Induk, UTeM: Open Shelf
| Call Number: |
TK7895 M4 M39 1996 |
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| Copy Unknown | Available Place a Hold |